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Localized Epidemic Detection in Networks with Overwhelming Noise

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Published:15 June 2015Publication History
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Abstract

We consider the problem of detecting an epidemic in a population where individual diagnoses are extremely noisy. We show that exclusively local, approximate knowledge of the contact network suffices to accurately detect the epidemic. The motivation for this problem is the plethora of examples (influenza strains in humans, or computer viruses in smartphones, etc.) where reliable diagnoses are scarce, but noisy data plentiful. In flu or phone-viruses, exceedingly few infected people/phones are professionally diagnosed (only a small fraction go to a doctor) but less reliable secondary signatures (e.g., people staying home, or greater-than-typical upload activity) are more readily available.

Our algorithm requires only local-neighbor knowledge of this graph, and in a broad array of settings that we describe, succeeds even when false negatives and false positives make up an overwhelming majority of the data available. Our results show it succeeds in the presence of partial information about the contact network, and also when are many (hundreds, in our examples) of initial patients-zero.

References

  1. C. Milling, C. Caramanis, S. Mannor, and S. Shakkottai, "Network forensics," in SIGMETRICS '12, vol. 40, no. 1, Jun. 2012, p. 223. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. E. A. Meirom, C. Milling, C. Caramanis, S. Mannor, A. Orda, and S. Shakkottai, "Localized epidemic detection in networks with overwhelming noise." {Online}. Available: http://arxiv.org/abs/1402.1263Google ScholarGoogle Scholar

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  1. Localized Epidemic Detection in Networks with Overwhelming Noise

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    • Published in

      cover image ACM SIGMETRICS Performance Evaluation Review
      ACM SIGMETRICS Performance Evaluation Review  Volume 43, Issue 1
      Performance evaluation review
      June 2015
      468 pages
      ISSN:0163-5999
      DOI:10.1145/2796314
      Issue’s Table of Contents
      • cover image ACM Conferences
        SIGMETRICS '15: Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
        June 2015
        488 pages
        ISBN:9781450334860
        DOI:10.1145/2745844

      Copyright © 2015 Owner/Author

      Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 15 June 2015

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