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"Microprocessor Aging Analysis and Reliability Modeling Due to Back-End ..."

Chang-Chih Chen, Linda S. Milor (2015)

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DOI: 10.1109/TVLSI.2014.2357756

access: closed

type: Journal Article

metadata version: 2022-01-03

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Chang-Chih Chen, Linda S. Milor:
Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms. IEEE Trans. Very Large Scale Integr. Syst. 23(10): 2065-2076 (2015)

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