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"AMR Steganalysis Based on Second-Order Difference of Pitch Delay."

Yanzhen Ren et al. (2017)

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DOI: 10.1109/TIFS.2016.2636087

access: closed

type: Journal Article

metadata version: 2023-12-15

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Yanzhen Ren, Jing Yang, Jinwei Wang, Lina Wang:
AMR Steganalysis Based on Second-Order Difference of Pitch Delay. IEEE Trans. Inf. Forensics Secur. 12(6): 1345-1357 (2017)

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