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"Instruction-based March Test Pattern Generation Scheme for At-Speed Test ..."

Seokmin Park et al. (2023)

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DOI: 10.1109/ICAIIC57133.2023.10067073

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-27

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  dblp key:
  - conf/icaiic/ParkLSLL23
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Seokmin Park, Gayeong Lee, Jaehwan Shin, Seunghan Lee, Young-Woo Lee:
Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction. ICAIIC 2023: 539-542

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