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A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs
2002
IEEE Journal of Solid-State Circuits
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A robust and efficient post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit is proposed in this paper. ...
In addition, an efficient bit-repair scheme is used instead of the conventional linerepair one, reducing a layout area for the redundancy bits. ...
Based on the previously developed antifuse-repairing scheme [1] , we suggest a robust and efficient post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit ...
doi:10.1109/4.982432
fatcat:b4b7ggewy5dlziy3uf6pi6bt7e
A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs
2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185)
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2004; you can also visit the original URL.
The file type is application/pdf.
A robust and efficient post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit is proposed in this paper. ...
In addition, an efficient bit-repair scheme is used instead of the conventional linerepair one, reducing a layout area for the redundancy bits. ...
Based on the previously developed antifuse-repairing scheme [1] , we suggest a robust and efficient post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit ...
doi:10.1109/vlsic.2001.934197
fatcat:fabhvswpk5gaboyrcj5qwnjlrq