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A Kalman Filter for Amplitude Estimation in High-Speed Dynamic Mode Atomic Force Microscopy
2016
IEEE Transactions on Control Systems Technology
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A fundamental challenge in dynamic mode atomic force microscopy (AFM) is the estimation of the cantilever oscillation amplitude from the deflection signal which might be distorted by noise and/or high-frequency ...
In this work, the authors propose the estimation of amplitude and phase using a linear time-varying Kalman filter which is easily extended to multiple frequencies. ...
ACKNOWLEDGMENT The research was performed in the Laboratory for Dynamics and Control of Nanosystems (LDCN) at The University of Newcastle, Callaghan, NSW, Australia. ...
doi:10.1109/tcst.2015.2435654
fatcat:2h55ofgvybcg5nl2aapmsr5req
Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy
2014
IEEE transactions on nanotechnology
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We present new insights into the modeling of the microcantilever in dynamic mode atomic force microscopy and outline a novel high-bandwidth tip-sample force estimation technique for the development of ...
technique on microcantilever dynamics and the amplitude demodulation technique. ...
Furthermore, they are all cast within the framework of amplitude modulation atomic force microscopy, where there are strict limits on the achievable imaging bandwidth. ...
doi:10.1109/tnano.2014.2360878
fatcat:skimxpsbbzb35o642ppw7jfzx4
A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy
2014
Review of Scientific Instruments
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While often overlooked, one of the prerequisites for high-speed amplitude modulation atomic force microscopy is a high-bandwidth amplitude estimation technique. ...
We conclude with the design and implementation of a custom circuit to experimentally demonstrate the improvements and discuss its application in high-speed and multifrequency atomic force microscopy. © ...
We believe this technique could find application in both high-speed and multifrequency atomic force microscopy. ...
doi:10.1063/1.4865841
pmid:24593371
fatcat:buyybtbylzcvjjyfmjojehdgou
Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm
2014
Review of Scientific Instruments
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Instrum. 70, 4300 (1999); 10.1063/1.1150069 High-resolution imaging of single-stranded DNA on mica surface under ultrahigh vacuum conditions by noncontact atomic force microscopy ...
Articles you may be interested in Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: Small amplitude small set-point imaging Appl. Phys. ...
CMMI-0845742 and by grants from the National Center for Research Resources (5R21RR025362-03) and the National Institute of General Medical Sciences (8 R21 GM103530-03) from the National Institutes of Health ...
doi:10.1063/1.4881682
pmid:24985865
pmcid:PMC4048448
fatcat:xlzkq555vfglrbqy5jwcjrtdta
Atomic-resolution noncontact atomic force microscopy in air
2003
Applied Physics Letters
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Atomic resolution by noncontact atomic force microscopy with a self-sensing quartz tuning fork is achieved in ambient conditions. ...
We have employed a trident-shape quartz crystal resonator oscillating at 1 MHz with a high spring constant of 4ϫ10 5 N/m, allowing subnanometer resolution of the cleaved mica in air. ...
Since the invention of scanning tunneling microscopy, 1 atomic resolution has been established, in a high vacuum condition, in atomic force microscopy ͑AFM͒ as well as in scanning tunneling microscopy ...
doi:10.1063/1.1606493
fatcat:ig5j2yyhwrbaheptc37nqbqhom
Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method
2007
American Control Conference (ACC)
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In these methods microcantilevers with high quality factor are employed for high force sensitivity but at the cost of speed due to dependence on steady-state signals. ...
Atomic force microscopes (AFMs) are the primary investigation systems at the nanoscale. ...
In this paper, the hitherto unexplored idea of transient force atomic microscopy (TF-AFM) that uses the transient part of cantilever response for imaging is reported. ...
doi:10.1109/acc.2007.4283047
dblp:conf/acc/SahooAS07
fatcat:z6ul7x7yzfgt5iyvar5czy44aa
High-speed atomic force microscopy with phase-detection
2012
Current applied physics
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High-speed image with scan rate of 100 Hz was obtained which were controlled with phase shift as a feedback signal. ...
In order to improve the scanning speed of tapping mode AFM, we have studied the phase-detection mode AFM with a high frequency (1.5 MHz) cantilever. ...
Introduction Though the atomic force microscopy (AFM) is considered as a very essential technique for nano-characterization and nano-manipulation fields, its slow imaging rate is a critical disadvantage ...
doi:10.1016/j.cap.2011.12.024
fatcat:c3h5qkj2cvgwzmr2og3bgml3wq
Imaging Cellular and Viral Materials with Small Cantilevers Developed for High Speed Atomic Force Microscopy
2007
Materials Research Society Symposium Proceedings
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High speed atomic force microscopy (AFM) holds the promise of investigating dynamic systems in real time with single molecule resolution. ...
Atomic force microscopy has been successfully used for investigations of many biological systems and materials in real life conditions, but taking AFM images takes too long to follow many biologically ...
Philipp Thurner for combining the individual tip slices into one 3D representation. We thank Veeco Instruments for help with instrumentation. ...
doi:10.1557/proc-1025-b03-03
fatcat:lbzyc4h4u5efzl5zjazra5azam
Fast-scanning shear-force microscopy using a high-frequency dithering probe
2000
Applied Physics Letters
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Therefore, it is desirable to enhance the speed for more extensive and practical uses. 1-6 Barrett and Quate 1 obtained a scanning speed of 1 mm/s by removing the feedback loop in contact-mode atomic force ...
We have demonstrated high-speed scanning shear-force microscopy using a fiber tip attached to quartz crystal vibrating at 2.0 MHz resonance frequency. ...
Kim for helpful discussions. This work was supported by the Creative Research Initiatives of the Korean Ministry of Science and Technology. ...
doi:10.1063/1.1334646
fatcat:fe4muwohfvcgnecy5nwkcsut3q
Torsional Resonance Mode Imaging for High-Speed Atomic Force Microscopy
2003
AIP Conference Proceedings
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The instrumentation of high-speed imaging has been a challenge for scanning probe-based technologies. ...
Atomic Force Microscope (AFM) dynamics are improved over TappingMode due to the much faster response of the TR amplitude signal when the tip is interacting with a surface. ...
ACKNOWLEDGMENTS The authors are indebted to Bob Daniels and Peter Neilson of Veeco Instruments Inc. for their technical assistance. We also appreciate the careful editing by Alan Rice, also of Veeco. ...
doi:10.1063/1.1639718
fatcat:weatr3dmijdmbanonpm7u4bs7e
Bimodal frequency-modulated atomic force microscopy with small cantilevers
2015
Nanoscale
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Small cantilevers with ultra-high resonant frequencies (1-3 MHz) have paved the way for high-speed atomic force microscopy. ...
However, their potential for multi-frequency atomic force microscopy is unexplored. ...
Herruzo and Amir Farokh Payam from the Instituto de Ciencia de Materiales de Madrid for fruitful discussions. We also thank the Center of Smart Interfaces for financial support. ...
doi:10.1039/c4nr05907g
pmid:25522181
fatcat:xubnwjdl6rbobg5bm6lou2qdue
Dynamics of Atomic Stick-Slip Friction Examined with Atomic Force Microscopy and Atomistic Simulations at Overlapping Speeds
2015
Physical Review Letters
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Atomic force microscopy (AFM) and atomistic simulations of atomic friction with silicon oxide tips sliding on Au(111) are conducted at overlapping speeds. ...
First observed using atomic force microscopy (AFM), atomic stick-slip often occurs when two clean surfaces, at least one of which is crystalline, slide in relative motion [4] . ...
of high speed data acquisition electronics. ...
doi:10.1103/physrevlett.114.146102
pmid:25910138
fatcat:os7jh6o7m5cytopjul3esc5f7a
State estimation for high-speed multifrequency atomic force microscopy
2016
2016 American Control Conference (ACC)
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A fundamental component in the z-axis feedback loop of an atomic force microscope (AFM) operated in dynamic mode is the lock-in amplifier to obtain amplitude and phase of the high-frequency cantilever ...
We propose to estimate amplitude and phase of multiple frequency components with a linear time-varying Kalman filter which allows for an efficient implementation on a Field Programmable Gate Array (FPGA ...
CONCLUSION In this work, we propose a linear time-varying Kalman filter to estimate amplitude and phase of multiple frequencies related to cantilever higher eigenmodes for multifrequency Atomic Force Microscopy ...
doi:10.1109/acc.2016.7525311
dblp:conf/amcc/RuppertHM16
fatcat:mgk22xqccrdghmeqj5qpl4aquu
Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
2018
Beilstein Journal of Nanotechnology
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This article proposes a model-based multifrequency Lyapunov filter implemented on a field-programmable gate array (FPGA) for high-speed MF-AFM demodulation. ...
An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. ...
Introduction Atomic force microscopy (AFM) [1] has been integral in the field of nanoscale engineering since its invention in 1986 by Binnig et al. ...
doi:10.3762/bjnano.9.47
pmid:29515961
pmcid:PMC5815288
fatcat:6jusmfnkvzd67ovk3jxmcn457m
High Speed AFM Imaging of Glutamate Receptor Activation
2011
Biophysical Journal
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In this investigation we have made single molecule measurements of homomeric GluA3 AMPAR reconstituted in mixedlipid supported membranes (ML-SLM) using both conventional and high-speed atomic force microscopy ...
We use atomic force microscopy nanografting (AFM-NG) to fabricate innovative nano-arrays for immuno-assay, with complete and efficient control on protein/antibody immobilization. ...
In this investigation we have made single molecule measurements of homomeric GluA3 AMPAR reconstituted in mixedlipid supported membranes (ML-SLM) using both conventional and high-speed atomic force microscopy ...
doi:10.1016/j.bpj.2010.12.1099
fatcat:pocvoqwqkfacrpmk2jvmta7dzy
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