A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2020; you can also visit the original URL.
The file type is application/pdf.
Filters
[New Products]
2020
IEEE Microwave Magazine
Preserved Fulltext
Primarily for use in the high-speed digital test market, this connector is designed for stripline applications. ...
What + If = IEEEPeople Driving Technological Innovation.ieee.org/membership #IEEEmember Primarily for
use in the high-
speed digital
test market,
this connector
is designed
for stripline
applications ...
doi:10.1109/mmm.2020.3015135
fatcat:jscbiep5dbeefkzvn2fd5iseui
Accurate characterization of PCB transmission lines for high speed interconnect
2015
2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf.
Accurate PCB transmission-line characterization can be challenging due to the effect of test fixtures and launching vias, etc. ...
Test boards built with varying lengths of transmission lines routed on different layers were then characterized with the new deembedding method. ...
test fixtures design. ...
doi:10.1109/apemc.2015.7175382
fatcat:2whmhaw5vzc7phlqo67ob6vjj4
Implementing bead probe technology for in-circuit test: A case study
2007
2007 IEEE International Test Conference
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2015; you can also visit the original URL.
The file type is application/pdf.
A major OEM implements bead probe technology on a new design to gain test access and coverage of high-speed circuits. ...
The experiences of a first implementation of bead probe technology are discussed here, including CAD issues at board layout, test fixture construction and debug, soldering process difficulties, and test ...
test coverage in the high-speed areas of the board. ...
doi:10.1109/test.2007.4437599
dblp:conf/itc/FarrellL07
fatcat:j7zfdv5t75blvesw7xc7xkowgu
Construction of an RF-band test fixture model using 3-D field simulator
2006
Microwave and optical technology letters (Print)
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2011; you can also visit the original URL.
The file type is application/pdf.
For design and characterization of packaged RF-band transistor amplifiers, test fixtures consisting of coaxial connectors and planar-type transmission lines are frequently used. ...
We present a method of extracting 3D field simulation parameters of these test fixtures and demonstrate that a circuit model of the test fixtures can be constructed by pure 3D field simulation using the ...
The long-SMA long-microstrip line (LSLM)-type test jig
Figure 1 1 Designed test jigs: (a) SSSM-type; (b) LSSM-type; (c) LSLMtype
Figure 2 2 Designed test fixtures for the LDMOS transistor amplifier ...
doi:10.1002/mop.21390
fatcat:o57qln6ysnhn7cc3q2mmliovpq
A bare-chip probe for high I/O, high speed testing
1994
IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2004; you can also visit the original URL.
The file type is application/pdf.
We will describe a bare chip probing fixture for temporary interconnection of a VLSI tester to a die. ...
In addition, we will briefly describe the potential for use as a very fast bare chip burn-in fixture. ...
Acknowledgements Thanks go to Chung Ho and Fariborz Agahdel of MicroModule Systems for the design and fabrication of the membrane, and to Steve Dielman and Matthias Werner of Hewlett Packard's Semiconductor ...
doi:10.1109/96.338731
fatcat:gctizqmj3rdoji7str5utf3oii
Research on Poppers Used as Electrical Connectors in High Speed Textile Transmission Lines
2016
Autex Research Journal
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2019; you can also visit the original URL.
The file type is application/pdf.
The aim of the present study was to examine the usefulness of poppers, widely used in clothing, as electrical connectors connecting parts of the textile signal lines designed for transmission of high-speed ...
This property and its stability are important in signal lines designed for high-speed data transmission. ...
The ability to transfer these signals allows one to use conventional poppers as an electrical connector in textile, signal lines for high-speed data transmission. ...
doi:10.1515/aut-2016-0025
fatcat:ke727b2fmvhqxo6kw4xop6ad7a
A novel procedure for characterization of multiport high-speed balanced devices
2006
2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006.
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2012; you can also visit the original URL.
The file type is application/pdf.
However, the challenge of building and compensating for test fixtures becomes increasingly difficult as industry requires faster data transmission. ...
Ideally, test fixtures are electrically transparent, but since this is not the case in practice, a method of compensating for its effects must be used to be able to obtain accurate measured data on the ...
Unfortunately, characterizing a fixture for an application where the DUT is a high-speed balanced structure is extremely challenging because, like the DUT, the fixture also needs to have a non- Figure ...
doi:10.1109/isemc.2006.1706334
fatcat:fnjtwmbz7zfkjmasx3oiw4iluy
UHV Slits
2007
AIP Conference Proceedings
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2006; you can also visit the original URL.
The file type is application/pdf.
Advanced Design Consulting, Inc. (ADC) designed slits for applications where high accuracy is required. ...
The total slit size is adjustable from 0 to 30 mm both vertically and horizontally depending on the flange size. Each of the four blades are individually controlled and motorized. ...
A test report, shipped with each unit, includes a residual gas analysis of each section showing the sum of all partial pressures for masses larger than 46 AMU is less than 10 -11 torr. ...
doi:10.1063/1.2436167
fatcat:caxyb6evcbgzpdio76wankko3i
Page 157 of Astronautics Vol. 6, Issue 10
[page]
1961
Astronautics
Preserved Fulltext
The Internet Archive has digitized a microfilm copy of this work. It may be possible to borrow a copy for reading.
employed in hypersonic testing, aerodynamic heating, gas dynamics, shock tube studies, and other fields requiring the measurement and analysis of high-speed radiated transients or con- centration temperatures ...
It is designed to eliminate connector wiring, soldering, and drilling the board for pins. ...
Fatigue response of selective laser melted Ti-6Al-4V bracket: an experimental study
2021
Procedia Structural Integrity
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2021; you can also visit the original URL.
The file type is application/pdf.
The results of the shaker table test suggested that the weight optimised SLM bracket has met its performance target. ...
The results of the shaker table test suggested that the weight optimised SLM bracket has met its performance target. ...
Daniel Cousins (Rolls-Royce Plc.) for his contribution on the development of bracket design. ...
doi:10.1016/j.prostr.2021.03.004
fatcat:yguqbainpjetzbyljl3xw4clra
Page 28 of Hewlett-Packard Journal Vol. 30, Issue 3
[page]
1979
Hewlett-Packard Journal
Preserved Fulltext
The Internet Archive has digitized a microfilm copy of this work. It may be possible to borrow a copy for reading.
User convenience rated a high priority in the design of the scanner. ...
The bed-of-nails fixture and the patch panel are easily removed as a unit to be replaced by another unit for testing a different board. ...
High-Frequency Modeling and Optimization of E/O Response and Reflection Characteristics of 40 Gb/s EML Module for Optical Transmitters
2012
ETRI Journal
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf.
A complete high-frequency small-signal circuit model of a 40 Gb/s butterfly electroabsorption modulator integrated laser module is presented for the first time to analyze and optimize its electro-optic ...
An agreement between measured and simulated results demonstrates the accuracy and validity of the procedures. ...
In theory, we can test the total frequency response of the test fixture, the receiver, and the device under test (DUT). A de-embedding method is employed in this test. ...
doi:10.4218/etrij.12.0111.0516
fatcat:lkq2ofcdqvecjpi2pms44kub5i
Page 47 of Diesel Progress Vol. 25, Issue
[page]
1959
Diesel Progress
Preserved Fulltext
The Internet Archive has digitized a microfilm copy of this work. It may be possible to borrow a copy for reading.
The process involves J-7509, a redesigned tester for popping, spray pattern, high and low pressure
and
le aks,
clisassembly
eu ]-6868, a new injector assembly
fixture; and J]-7041, a new comparator
for ...
fit all of the Detroit Diesel injectors
J-6868 injector assembly and disas- sembly fixture is 8 in. wide, 6 in. deep and 10 in. high. ...
Page 19 of Hewlett-Packard Journal Vol. 35, Issue 10
[page]
1984
Hewlett-Packard Journal
Preserved Fulltext
The Internet Archive has digitized a microfilm copy of this work. It may be possible to borrow a copy for reading.
The digital scanner card has been designed so that the test pin elec- tronics are very close to the test fixture connector. ...
The HP 3065 reduces this problem by giving the user the choice of two edge speeds at which to run tests. The slow edge speed (40 V/us into 909) is designed specifically for CMOS testing. ...
High-performance inter-PCB connectors: analysis of EMI characteristics
2002
IEEE transactions on electromagnetic compatibility (Print)
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf.
EMI characteristics of the connectors are demonstrated by investigating a few aspects of the design: type of shield/ground blade for signal return, number and length of ground pins, signal pin designation ...
The EMI performance of a lab-constructed stacked-card connector, and a commercially available module-on-backplane connector were studied. ...
Proper design of the inter-board connector including signal designations, and the signal-return geometry is necessary for meeting EMI requirements in high-speed digital designs. ...
doi:10.1109/15.990723
fatcat:njb2imu4sfbltjqudjn2rrr7zm
« Previous
Showing results 1 — 15 out of 2,683 results