In this paper, we propose a system-level framework for the analysis of temperature-induced failures that considers the uncertainty due to process variation. As ...

Electronic system designs that ignore process variation are unreliable and inefficient. In this work, we propose a system-level framework for the analysis ...

Abstract—Electronic system designs that ignore process vari- ation are unreliable and inefficient. In this paper, we propose a system-level framework for ...

In this paper, we propose asystem-level framework for the analysis of temperature-inducedfailures that considers the uncertainty due to process variation.As an ...

Temperature-Centric Reliability Analysis and Optimization of Electronic Systems Under Process Variation. I Ukhov, P Eles, Z Peng. Very Large Scale Integration ...

Temperature-Centric Reliability Analysis and Optimization of Electronic Systems Under Process Variation. I Ukhov, P Eles, Z Peng. Very Large Scale Integration ...

Sep 11, 2017 · “Temperature-centric reliability analysis and optimization of electronic systems under process variation.” In: IEEE Transactions on VLSI Systems ...

Embedded Systems Laboratory, Linköping University. 2015 slide. Temperature-Centric Reliability Analysis and Optimization under Process Variation. Department of ...

Temperature-Centric Reliability Analysis and Optimization of Electronic Systems Under Process Variation ... Under Process Variation for Electronic System Design.

Temperature-Centric Reliability Analysis and Optimization of Electronic Systems under Process Variation. IEEE Transactions on Very Large Scale Integration ...