Jan 24, 2013 · This paper presents an analysis of the effects and propagations of different faults such as Single Event Transient (SET), Multiple Event ...

PDF | This paper presents an analysis of the effects and propagations of different faults such as Single Event Transient (SET), Multiple Event.

Analysis of the effects and propagations of different faults by simulation-based fault injection into Areoflex Gaisler LEON3 processor shows integer unit ...

This paper presents an analysis of the effects and propagations of different faults such as Single Event Transient (SET), Multiple Event Transients (MET), ...

Bibliographic details on Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets.

Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets. H Abbasitabar, HR Zarandi, R Salamat.

Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets. H Abbasitabar, HR Zarandi, R Salamat. Proceedings of the 2012 ...

Susceptibility Analysis of LEON3 Embedded Processor Against Multiple Event Transients and Upsets. Conference Paper. Full-text available. Dec 2012.

Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets. CSE 2012: 548-553. [+][–]. Coauthor network. maximize. Note ...

Feb 21, 2016 · Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets. CSE '12: Proceedings of the 2012 IEEE 15th ...