Aug 11, 2014 · Novel self-test methods to reduce on-chip memory requirements and improved test coverage. Abstract: Self-Test is one of the most important ...

PDF | This paper describes a methodology of creating a built-in test system of a system on chip and experimental results of the system application on.

– Writes incoming flits from asynchronous FIFO to PD memory. – Decodes packet header from PD memory, extracts control information required by the core, and ...

Mar 10, 2008 · This paper proposes a methodology for reducing the test data volume for the application of SoC Low-Cost test procedures. The method exploits a ...

Jul 10, 2021 · This research proposed a novel memory BIST algorithm to test the various memories for multiple faults in an SoC-based device. The memory BIST ...

Hardware-based self-testing techniques have limitations in the performance and area overhead. Those can be eliminated using software-based self-testing.

A Novel Built-in Self Calibration Technique to Minimize Capacitor Mismatch for 12-bit 32MS/s SAR ADC · Fault modeling and design-for-test of MEMS · Software based ...

Novel self-test methods to reduce on-chip memory requirements and improved test coverage ... This work will show how deterministic ATPG can be used in a novel ...

This paper describes a hardware/software strategy for the effective and efficient management of several distributed Memory Built-In Self-Test (MBIST) units ...

We have developed for this purpose a novel hierarchical test generation algorithm and demonstrated the usefulness of the generated tests not only for ...