The test power can be minimized as it is proportional to the number of overall transitions. We applied our method on several benchmark circuits. The ...

Abstract—Scan design is a good design-for-testability (DfT) discipline but always incurs high power dissipation during test application.

A scan design method based on two complementary connection styles to minimize test power ... method based on two complementary scan cell connection styles to ...

We introduce the scan cells with complementary outputs to enable two alternative connection styles between scan cells during the process of scan cell ordering.

Ayiao Cui, Tingting Yu, Mengyang Li, Gang Qu: A scan design method based on two complementary connection styles to minimize test power. ISCAS 2015: 625-628.

Bibliographic details on A scan design method based on two complementary connection styles to minimize test power.

A new method to cluster flip-flops into scan chains is presented, which minimizes the power consumption during test and can improve the performance of any ...

A Scan Design Method Based On Two Complementary Connection Styles To Minimize Test Power ... Based On Two Complementary Connection Styles To Minimize Test Power.

The scan design technique is a structured approach to design sequential circuits for testability. The storage cells in registers are used as observation points, ...

Jan 1, 2024 · – The process of reordering the scan chains based on the physical scan cell locations, in order to minimize the amount of interconnect wires.