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@inproceedings{DBLP:conf/iolts/AmarnathMMC22,
author = {Chandramouli N. Amarnath and
Mohamed Mejri and
Kwondo Ma and
Abhijit Chatterjee},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897815},
doi = {10.1109/IOLTS56730.2022.9897815},
timestamp = {Thu, 06 Oct 2022 14:48:19 +0200},
biburl = {https://dblp.org/rec/conf/iolts/AmarnathMMC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BaheriGCL22,
author = {Betis Baheri and
Qiang Guan and
Vipin Chaudhary and
Ang Li},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Quantum Noise in the Flow of Time: {A} Temporal Study of the Noise
in Quantum Computers},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897404},
doi = {10.1109/IOLTS56730.2022.9897404},
timestamp = {Tue, 29 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/BaheriGCL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BalaKJO22,
author = {Anu Bala and
Saurabh Khandelwal and
Abusaleh M. Jabir and
Marco Ottavi},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Yield Evaluation of Faulty Memristive Crossbar Array-based Neural
Networks with Repairability},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897183},
doi = {10.1109/IOLTS56730.2022.9897183},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/BalaKJO22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BellarminoCHKSS22,
author = {Nicol{\`{o}} Bellarmino and
Riccardo Cantoro and
Martin Huch and
Tobias Kilian and
Ulf Schlichtmann and
Giovanni Squillero},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Microcontroller Performance Screening: Optimizing the Characterization
in the Presence of Anomalous and Noisy Data},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897769},
doi = {10.1109/IOLTS56730.2022.9897769},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/BellarminoCHKSS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BernardiCCDFFGG22,
author = {Paolo Bernardi and
Riccardo Cantoro and
Anthony Coyette and
W. Dobbeleare and
Moritz Fieback and
Andrea Floridia and
G. Gielenk and
Jhon Gomez and
Michelangelo Grosso and
Andrea Guerriero and
Iacopo Guglielminetti and
Said Hamdioui and
Giorgio Insinga and
N. Mautone and
Nunzio Mirabella and
Sandro Sartoni and
Matteo Sonza Reorda and
Rudolf Ullmann and
Ronny Vanhooren and
N. Xamak and
Lizhou Wu},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Recent Trends and Perspectives on Defect-Oriented Testing},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897647},
doi = {10.1109/IOLTS56730.2022.9897647},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/BernardiCCDFFGG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/CasciolaGD0RM22,
author = {Nadir Casciola and
Edoardo Giusto and
Emanuele Dri and
Daniel Oliveira and
Paolo Rech and
Bartolomeo Montrucchio},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Understanding the Impact of Cutting in Quantum Circuits Reliability
to Transient Faults},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897308},
doi = {10.1109/IOLTS56730.2022.9897308},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/CasciolaGD0RM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/CavagneroSCATR22,
author = {Niccol{\`{o}} Cavagnero and
Fernando Fernandes dos Santos and
Marco Ciccone and
Giuseppe Averta and
Tatiana Tommasi and
Paolo Rech},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Transient-Fault-Aware Design and Training to Enhance DNNs Reliability
with Zero-Overhead},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897813},
doi = {10.1109/IOLTS56730.2022.9897813},
timestamp = {Sun, 17 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/CavagneroSCATR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ChaudhuriBC22,
author = {Arjun Chaudhuri and
Sanmitra Banerjee and
Krishnendu Chakrabarty},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Structural Test Generation for {AI} Accelerators using Neural Twins},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897773},
doi = {10.1109/IOLTS56730.2022.9897773},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/ChaudhuriBC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/CorrenteBR22,
author = {Giovanni Corrente and
Nella Bentivegna and
Sebastiano Russo},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Power Cycling Body Diode Current Flow on SiC {MOSFET} Device},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897452},
doi = {10.1109/IOLTS56730.2022.9897452},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/CorrenteBR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/CruzVRHD22,
author = {William Souza da Cruz and
Raphael Viera and
Jean{-}Baptiste Rigaud and
Guillaume Hubert and
Jean{-}Max Dutertre},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {An Experimentally Tuned Compact Electrical Model for Laser Fault Injection
Simulation},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897189},
doi = {10.1109/IOLTS56730.2022.9897189},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/CruzVRHD22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/DuchrauG22,
author = {Georg Duchrau and
Michael G{\"{o}}ssel},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {A New Decoding Method for Double Error Correcting Cross Parity Codes},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897284},
doi = {10.1109/IOLTS56730.2022.9897284},
timestamp = {Tue, 29 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/DuchrauG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/FiorucciNDR22,
author = {Tiziano Fiorucci and
Giorgio Di Natale and
Jean{-}Marc Daveau and
Philippe Roche},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Software Product Reliability Based on Basic Block Metrics Recomposition},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897289},
doi = {10.1109/IOLTS56730.2022.9897289},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/FiorucciNDR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GavariniSRBS22,
author = {Gabriele Gavarini and
Diego Stucchi and
Annachiara Ruospo and
Giacomo Boracchi and
Ernesto S{\'{a}}nchez},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Open-Set Recognition: an Inexpensive Strategy to Increase {DNN} Reliability},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897805},
doi = {10.1109/IOLTS56730.2022.9897805},
timestamp = {Wed, 07 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/GavariniSRBS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GrossiO0MM22,
author = {Marco Grossi and
Martin Oma{\~{n}}a and
Daniele Rossi and
Biagio Marzulli and
Cecilia Metra},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Novel {BTI} Robust Ring-Oscillator-Based Physically Unclonable Function},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897808},
doi = {10.1109/IOLTS56730.2022.9897808},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GrossiO0MM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Guerrero-Balaguera22,
author = {Juan{-}David Guerrero{-}Balaguera and
Robert Limas Sierra and
Matteo Sonza Reorda},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Effective fault simulation of GPU's permanent faults for reliability
estimation of CNNs},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897823},
doi = {10.1109/IOLTS56730.2022.9897823},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Guerrero-Balaguera22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GuhaSM22,
author = {Krishnendu Guha and
Sangeet Saha and
Klaus D. McDonald{-}Maier},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {{SENAS:} Security driven ENergy Aware Scheduler for Real Time Approximate
Computing Tasks on Multi-Processor Systems},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897811},
doi = {10.1109/IOLTS56730.2022.9897811},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/GuhaSM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/HectorMDD22,
author = {Kevin Hector and
Pierre{-}Alain Mo{\"{e}}llic and
Mathieu Dumont and
Jean{-}Max Dutertre},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural
Networks},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897693},
doi = {10.1109/IOLTS56730.2022.9897693},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/HectorMDD22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/HemaramMT22,
author = {Surendra Hemaram and
Mahta Mayahinia and
Mehdi B. Tahoori},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Adaptive Block Error Correction for Memristive Crossbars},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897817},
doi = {10.1109/IOLTS56730.2022.9897817},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/HemaramMT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/HisafuruTT22,
author = {Kota Hisafuru and
Kazunari Takasaki and
Nozomu Togawa},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {An Anomalous Behavior Detection Method for IoT Devices Based on Power
Waveform Shapes},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897477},
doi = {10.1109/IOLTS56730.2022.9897477},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/HisafuruTT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/IslamK22,
author = {Md. Nazmul Islam and
Sandip Kundu},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {A Software Approach Towards Defeating Power Management Side Channel
Leakage},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897191},
doi = {10.1109/IOLTS56730.2022.9897191},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/IslamK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KoufopoulouXPPH22,
author = {Amalia{-}Artemis Koufopoulou and
Kalliopi Xevgeni and
Athanasios Papadimitriou and
Mihalis Psarakis and
David H{\'{e}}ly},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Security and Reliability Evaluation of Countermeasures implemented
using High-Level Synthesis},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--8},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897824},
doi = {10.1109/IOLTS56730.2022.9897824},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/KoufopoulouXPPH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KritikakouNRPKM22,
author = {Angeliki Kritikakou and
Panagiota Nikolaou and
Ivan Rodriguez{-}Ferrandez and
Joseph Paturel and
Leonidas Kosmidis and
Maria K. Michael and
Olivier Sentieys and
David Steenari},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Functional and Timing Implications of Transient Faults in Critical
Systems},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897537},
doi = {10.1109/IOLTS56730.2022.9897537},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/KritikakouNRPKM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KumarRPA22,
author = {Gaurav Kumar and
Anjum Riaz and
Yamuna Prasad and
Satyadev Ahlawat},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {On Attacking {IJTAG} Architecture based on Locking {SIB} with Security
{LFSR}},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897172},
doi = {10.1109/IOLTS56730.2022.9897172},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/KumarRPA22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KunduB22,
author = {Shamik Kundu and
Kanad Basu},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Detecting Functional Safety Violations in Online {AI} Accelerators},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897702},
doi = {10.1109/IOLTS56730.2022.9897702},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/KunduB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/MartinoliTBL22,
author = {Valentin Martinoli and
Yannick Teglia and
Abdellah Bouagoun and
R{\'{e}}gis Leveugle},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Recovering Information on the {CVA6} {RISC-V} {CPU} with a Baremetal
Micro-Architectural Covert Channel},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897297},
doi = {10.1109/IOLTS56730.2022.9897297},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/MartinoliTBL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/NakajimaIFK22,
author = {Ryuichi Nakajima and
Kazuya Ioki and
Jun Furuta and
Kazutoshi Kobayashi},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads
with 1/100 Lower {\(\alpha\)}-SER in a 130 nm Bulk Process},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897814},
doi = {10.1109/IOLTS56730.2022.9897814},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/NakajimaIFK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/NosratiJN22,
author = {Nooshin Nosrati and
Maksim Jenihhin and
Zainalabedin Navabi},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {{MLC:} {A} Machine Learning Based Checker For Soft Error Detection
In Embedded Processors},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897309},
doi = {10.1109/IOLTS56730.2022.9897309},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/NosratiJN22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Oberti0SPBC22,
author = {Franco Oberti and
Ernesto S{\'{a}}nchez and
Alessandro Savino and
Filippo Parisi and
Mirco Brero and
Stefano Di Carlo},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {{LIN-MM:} Multiplexed Message Authentication Code for Local Interconnect
Network message authentication in road vehicles},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897819},
doi = {10.1109/IOLTS56730.2022.9897819},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Oberti0SPBC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PaudelT22,
author = {Bijay Raj Paudel and
Spyros Tragoudas},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Compressed Learning in {MCA} Architectures to Tolerate Malicious Noise},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--8},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897622},
doi = {10.1109/IOLTS56730.2022.9897622},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/PaudelT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PortaluriASSC22,
author = {Andrea Portaluri and
Sarah Azimi and
Corrado De Sio and
Luca Sterpone and
David Merodio Codinachs},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Radiation-induced Effects on {DMA} Data Transfer in Reconfigurable
Devices},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897262},
doi = {10.1109/IOLTS56730.2022.9897262},
timestamp = {Sat, 02 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/PortaluriASSC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Rodriguez-Ferrandez22,
author = {Ivan Rodriguez{-}Ferrandez and
Maris Tali and
Leonidas Kosmidis and
Marta Rovituso and
David Steenari},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Sources of Single Event Effects in the {NVIDIA} Xavier SoC Family
under Proton Irradiation},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897236},
doi = {10.1109/IOLTS56730.2022.9897236},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/Rodriguez-Ferrandez22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SantosKS22,
author = {Fernando Fernandes dos Santos and
Angeliki Kritikakou and
Olivier Sentieys},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Experimental evaluation of neutron-induced errors on a multicore {RISC-V}
platform},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897448},
doi = {10.1109/IOLTS56730.2022.9897448},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/SantosKS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SayadiAAPA0T22,
author = {Hossein Sayadi and
Mehrdad Aliasgari and
Furkan Aydin and
Seetal Potluri and
Aydin Aysu and
Jack Edmonds and
Sara Tehranipoor},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Towards AI-Enabled Hardware Security: Challenges and Opportunities},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897507},
doi = {10.1109/IOLTS56730.2022.9897507},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/SayadiAAPA0T22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SekyereS022,
author = {Michael Sekyere and
Marampally Saikiran and
Degang Chen},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {All Digital Low-Cost Built-in Defect Testing Strategy for Operational
Amplifiers with High Coverage},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897224},
doi = {10.1109/IOLTS56730.2022.9897224},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/SekyereS022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/TaheriS0J22,
author = {Mahdi Taheri and
Saeideh Sheikhpour and
Ali Mahani and
Maksim Jenihhin},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {A Novel Fault-Tolerant Logic Style with Self-Checking Capability},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897818},
doi = {10.1109/IOLTS56730.2022.9897818},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/TaheriS0J22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/YamashitaKHHFT22,
author = {Kazuki Yamashita and
Tomohiro Kato and
Kento Hasegawa and
Seira Hidano and
Kazuhide Fukushima and
Nozomu Togawa},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Effective Hardware-Trojan Feature Extraction Against Adversarial Attacks
at Gate-Level Netlists},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897557},
doi = {10.1109/IOLTS56730.2022.9897557},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/YamashitaKHHFT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ZoniosT22,
author = {Christos Zonios and
Vasileios Tenentes},
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {{REVOLVER:} {A} Zero-Step Execution Emulation Framework for Mitigating
Power Side-Channel Attacks on {ARM64}},
booktitle = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022.9897425},
doi = {10.1109/IOLTS56730.2022.9897425},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/ZoniosT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2022,
editor = {Alessandro Savino and
Paolo Rech and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {28th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2022, Torino, Italy, September 12-14, 2022},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IOLTS56730.2022},
doi = {10.1109/IOLTS56730.2022},
isbn = {978-1-6654-7355-2},
timestamp = {Thu, 06 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/2022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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