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BibTeX record conf/icaiic/ParkLSLL23

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@inproceedings{DBLP:conf/icaiic/ParkLSLL23,
  author       = {Seokmin Park and
                  Gayeong Lee and
                  Jaehwan Shin and
                  Seunghan Lee and
                  Young{-}Woo Lee},
  title        = {Instruction-based March Test Pattern Generation Scheme for At-Speed
                  Test Cost Reduction},
  booktitle    = {International Conference on Artificial Intelligence in Information
                  and Communication, {ICAIIC} 2023, Bali, Indonesia, February 20-23,
                  2023},
  pages        = {539--542},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICAIIC57133.2023.10067073},
  doi          = {10.1109/ICAIIC57133.2023.10067073},
  timestamp    = {Thu, 27 Apr 2023 14:58:47 +0200},
  biburl       = {https://dblp.org/rec/conf/icaiic/ParkLSLL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}