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BibTeX record conf/icaiic/ParkLSLL23
@inproceedings{DBLP:conf/icaiic/ParkLSLL23, author = {Seokmin Park and Gayeong Lee and Jaehwan Shin and Seunghan Lee and Young{-}Woo Lee}, title = {Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction}, booktitle = {International Conference on Artificial Intelligence in Information and Communication, {ICAIIC} 2023, Bali, Indonesia, February 20-23, 2023}, pages = {539--542}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ICAIIC57133.2023.10067073}, doi = {10.1109/ICAIIC57133.2023.10067073}, timestamp = {Thu, 27 Apr 2023 14:58:47 +0200}, biburl = {https://dblp.org/rec/conf/icaiic/ParkLSLL23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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