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ORCIDNicholas G. Paulter Jr.
Person information
- affiliation: National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA
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2020 – today
- 2022
[j24]Luca De Vito, John R. Jendzurski, Sergio Rapuano
, William B. Boyer, Jerome J. Blair, Nicholas G. Paulter:
The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021. IEEE Instrum. Meas. Mag. 25(8): 16-18 (2022)- 2021
- [j23]Luca De Vito, John R. Jendzurski, Sergio Rapuano, William B. Boyer, Jerome J. Blair, Nicholas G. Paulter:
The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee. IEEE Instrum. Meas. Mag. 24(8): 7-10 (2021) - [j22]Jack L. Glover, Praful Gupta, Nicholas G. Paulter, Alan C. Bovik:
Study of Bomb Technician Threat Identification Performance on Degraded X-ray Images. J. Percept. Imaging 4(1): 10502-1 (2021) - 2020
- [j21]Sergio Rapuano, John R. Jendzurski, Luca De Vito, Steven J. Tilden, William B. Boyer, Nicholas G. Paulter:
The documentary standards of the IEEE technical committee 10. IEEE Instrum. Meas. Mag. 23(8): 8-13 (2020) - [c9]Norimitsu Ichikawa, Hiroki Kimura, Petru V. Notingher, Nicholas G. Paulter:
Electrostatically Induced Voltage in Metal Box When Charged Object Like Hand Moves Away from the Box to Three Directions. IAS 2020: 1-6 - [c8]Steven A. Grosz, Joshua J. Engelsma, Nicholas G. Paulter Jr., Anil K. Jain:
White-Box Evaluation of Fingerprint Matchers: Robustness to Minutiae Perturbations. IJCB 2020: 1-10
2010 – 2019
- 2019
- [j20]Praful Gupta, Zeina Sinno, Jack L. Glover, Nicholas G. Paulter Jr., Alan C. Bovik:
Predicting Detection Performance on Security X-Ray Images as a Function of Image Quality. IEEE Trans. Image Process. 28(7): 3328-3342 (2019) - [i2]Steven A. Grosz, Joshua J. Engelsma, Nicholas G. Paulter Jr., Anil K. Jain:
White-Box Evaluation of Fingerprint Matchers. CoRR abs/1909.00799 (2019) - 2018
- [j19]Praful Gupta, Christos G. Bampis, Jack L. Glover, Nicholas G. Paulter Jr., Alan C. Bovik:
Multivariate Statistical Approach to Image Quality Tasks. J. Imaging 4(10): 117 (2018) - [j18]Joshua J. Engelsma, Sunpreet S. Arora, Anil K. Jain, Nicholas G. Paulter:
Universal 3D Wearable Fingerprint Targets: Advancing Fingerprint Reader Evaluations. IEEE Trans. Inf. Forensics Secur. 13(6): 1564-1578 (2018) - 2017
- [j17]Sunpreet S. Arora, Anil K. Jain, Nicholas G. Paulter Jr.:
Gold Fingers: 3D Targets for Evaluating Capacitive Readers. IEEE Trans. Inf. Forensics Secur. 12(9): 2067-2077 (2017) - [c7]Tarang Chugh, Sunpreet S. Arora, Anil K. Jain, Nicholas G. Paulter Jr.:
Benchmarking Fingerprint Minutiae Extractors. BIOSIG 2017: 105-116 - [i1]Joshua J. Engelsma, Sunpreet S. Arora, Anil K. Jain, Nicholas G. Paulter Jr.:
Universal 3D Wearable Fingerprint Targets: Advancing Fingerprint Reader Evaluations. CoRR abs/1705.07972 (2017) - 2016
- [j16]Sunpreet S. Arora, Kai Cao, Anil K. Jain, Nicholas G. Paulter Jr.:
Design and Fabrication of 3D Fingerprint Targets. IEEE Trans. Inf. Forensics Secur. 11(10): 2284-2297 (2016) - [j15]Todd Richard Goodall, Alan Conrad Bovik, Nicholas G. Paulter Jr.:
Tasking on Natural Statistics of Infrared Images. IEEE Trans. Image Process. 25(1): 65-79 (2016) - [c6]Sunpreet S. Arora, Anil K. Jain, Nicholas G. Paulter Jr.:
3D Whole Hand Targets: Evaluating Slap and Contactless Fingerprint Readers. BIOSIG 2016: 63-74 - 2015
- [c5]Todd Richard Goodall, Alan C. Bovik, Haris Vikalo, Nicholas G. Paulter Jr.:
Non-uniformity correction of IR images using natural scene statistics. GlobalSIP 2015: 230-234 - 2014
- [c4]Sunpreet S. Arora, Kai Cao, Anil K. Jain, Nicholas G. Paulter Jr.:
3D Fingerprint Phantoms. ICPR 2014: 684-689 - 2013
- [c3]Nicholas G. Paulter, John R. Jendzurski, Mike McTigue, Bill Hagerup, Thomas Linnenbrink:
The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes. I2MTC 2013: 1412-1415 - [c2]Qijun Zhao, Yi Zhang, Anil K. Jain, Nicholas G. Paulter Jr., Melissa Taylor:
A generative model for fingerprint minutiae. ICB 2013: 1-8 - 2012
- [j14]Nicholas G. Paulter Jr., Donald R. Larson:
Pulse metrology - Part 2. IEEE Instrum. Meas. Mag. 15(3): 43-47 (2012) - [c1]Qijun Zhao, Anil K. Jain, Nicholas G. Paulter Jr., Melissa Taylor:
Fingerprint image synthesis based on statistical feature models. BTAS 2012: 23-30
2000 – 2009
- 2007
- [j13]Nicholas G. Paulter Jr., Donald R. Larson:
Impedance of Transfer Standards Used in the Calibration of High-Speed Samplers and Pulse Generators. IEEE Trans. Instrum. Meas. 56(5): 1930-1934 (2007) - [j12]Nicholas G. Paulter Jr., Donald R. Larson:
Uncertainty in the Nose-to-Nose Sampler Calibration Method Due to the Assertion That the Generator and Receiver Functions Are Identical. IEEE Trans. Instrum. Meas. 56(6): 2570-2576 (2007) - 2005
- [j11]Donald R. Larson, Nicholas G. Paulter Jr., David I. Bergman:
Pulse parameter dependence on transition occurrence instant and waveform epoch. IEEE Trans. Instrum. Meas. 54(4): 1520-1526 (2005) - 2004
- [j10]Nicholas G. Paulter Jr., Donald R. Larson, Jerome J. Blair:
The IEEE standard on transitions, pulses, and related waveforms, Std-181-2003. IEEE Trans. Instrum. Meas. 53(4): 1209-1217 (2004) - 2003
- [j9]Nicholas G. Paulter Jr., Donald R. Larson:
Sources of uncertainty in the nose-to-nose sampler calibration method. IEEE Trans. Instrum. Meas. 52(5): 1618-1626 (2003) - [j8]Nicholas G. Paulter Jr., Andrew J. A. Smith, Donald R. Larson, T. Michael Souders, A. G. Roddie:
NIST-NPL interlaboratory pulse measurement comparison. IEEE Trans. Instrum. Meas. 52(6): 1825-1833 (2003) - 2001
- [j7]Donald R. Larson, Nicholas G. Paulter Jr.:
The effects of offset voltage on the amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method. IEEE Trans. Instrum. Meas. 50(4): 872-876 (2001) - [j6]Nicholas G. Paulter Jr., Donald R. Larson:
An examination of the spectra of the "Kick-Out" pulses for a proposed sampling oscilloscope calibration method. IEEE Trans. Instrum. Meas. 50(5): 1221-1223 (2001) - [j5]Nicholas G. Paulter Jr.:
An assessment on the accuracy of time-domain reflectometry for measuring the characteristic impedance of transmission lines. IEEE Trans. Instrum. Meas. 50(5): 1381-1388 (2001)
1990 – 1999
- 1998
- [j4]Nicholas G. Paulter Jr.:
Low-jitter trigger system for pulse calibration and intercomparison of high-speed samplers. IEEE Trans. Instrum. Meas. 47(3): 606-608 (1998) - [j3]Nicholas G. Paulter Jr.:
The effect of histogram size on histogram-derived pulse parameters. IEEE Trans. Instrum. Meas. 47(3): 609-612 (1998) - [j2]John P. Deyst, Nicholas G. Paulter Jr., Tamás Dabóczi, Gerard N. Stenbakken, T. Michael Souders:
A fast-pulse oscilloscope calibration system. IEEE Trans. Instrum. Meas. 47(5): 1037-1041 (1998) - [j1]Nicholas G. Paulter Jr.:
Long-term repeatability of a TDR-based printed wiring board dielectric constant measurement system. IEEE Trans. Instrum. Meas. 47(6): 1469-1473 (1998)
Coauthor Index
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